Design Methodology and Metrics for Robust and Highly Qualified Security Modules in Trusted Environments

EPI Consortium members published “Design Methodology and Metrics for Robust and Highly Qualified Security Modules in Trusted Environments” in Electronics.

Here you can find a link to an open access version of the article: https://www.mdpi.com/2079-9292/12/23/4843

DOI: https://doi.org/10.3390/electronics12234843

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Publication Type: Journal Article

Year of Publication: 2023

Authors: Authors listed in alphabetical order: - Luca Crocetti - Pietro Nannipieri - Sergio Saponara - Stefano Di Matteo

Publisher: MDPI

Name of publication/Event: Electronics

ISSN Number:

Keywords:

URL: https://doi.org/10.3390/electronics12234843

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Design Methodology and Metrics for Robust and Highly Qualified Security Modules in Trusted Environments

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